Atomic Force Microscopy (AFM) Imaging Service

Introduction

The Atomic Force Microscope (AFM) stands as an analytical tool used for examining the surface characteristics of diverse solid substances, encompassing insulators, by utilizing its scanning probe mechanism. It investigates the surface structure and properties of materials by detecting the extremely weak atomic interactions between the sample surface and a miniature force-sensitive component, and it has extensive applications in the field of physics.

The advent of single-cell force spectroscopy based on AFM has transformed the traditional research model in life sciences, which is primarily based on biochemistry. It has introduced a new perspective grounded in mechanical characterization, representing a significant breakthrough in life science research methodologies. At present, this technique is being extensively utilized in medical and life science research.

Fig.1 Schematic representations of atomic force microscopy (AFM)¹.

Advantages

The Atomic Force Microscope (AFM) boasts a multitude of merits that eclipse those of both the optical microscope/profiler and the Scanning Electron Microscope (SEM). Unlike optical profiling techniques, the AFM makes direct physical contact with the sample surface, thereby circumventing inaccuracies that may arise due to surface optical reflection, optical interference, or surface transparency. This enables the AFM to deliver exceptionally precise measurements of feature heights ranging from 1 nm to 1 μm. In contrast to the SEM, which is confined to quantitative measurements in the X and Y axes, the AFM offers a comprehensive three-dimensional surface profile, inclusive of the Z height measurement. Moreover, AFM scanning facilitates wholly non-destructive imaging of the sample surface, a stark contrast to SEM imaging, which typically necessitates the sputtering of a thin gold layer that can potentially modify surface conditions.

Measurements

3D topography Imaging
Surface Profiling
Height measurement (from 0.1nm to 15um)
Mechanical Mapping
Modulus and Stiffness
Surface Adhesion
Surface Friction
Electrical/Magnetic Properties
Chemical/Bio Properties

Sample Requirements

Sample state: The sample can be in the form of powder, bulk, or thin film.
Powder samples: Generally, particles should not exceed 5 μm. Please provide 20 mg of the sample. For liquids, provide no less than 1 ml. For oversized samples, please contact us for more guidance.
For powder/liquid samples, please specific the sample preparation conditions, including dispersion liquid, ultrasonic time, and concentration.
Thin film or bulk samples size requirements: Length and width should be between 0.5-3 cm, thickness between 0.1-1 cm. The surface roughness should not exceed 5 μm. Please clearly indicate the test surface.
For materials that require testing for voltage or surface potential need to be prepared on a conductive substrate, with the smallest acceptable substrate size being 1*1 cm. For any other questions, please consult us.

Creative Biolabs' Atomic Force Microscopy (AFM) Imaging Service

Creative Biolabs, a pioneer in the field of nanotechnology, offers a state-of-the-art AFM imaging service tailored to meet the diverse needs of researchers and industries. With a team of seasoned experts and cutting-edge AFM systems, Creative Biolabs ensures high-quality imaging with unparalleled resolution.

The company's AFM service is not limited to mere imaging. It extends to comprehensive sample characterization, high-force resolution, and advanced sample preparation techniques. By combining AFM with other spectroscopic methods, Creative Biolabs provides a holistic view of the sample, offering insights that go beyond surface topography.

For more information, please contact us.

FAQs

Q1: Why can't the particles or surface roughness of the AFM test sample be too large?

A: Generally, the Z-axis range of AFM instruments is about 10 μm (some instruments may only be 2 μm). Therefore, samples with large surface undulations may exceed the scan range of the instrument. Additionally, samples with a high degree of roughness can cause the probe tip to wear or become contaminated, which greatly affects image quality and increases consumable costs due to irreparable wear.

Q2: What happens if the AFM fails to achieve the intended outcome, and the surface's texture or unevenness doesn't match the anticipated results?

A: AFM imaging requires continuous searching for the appropriate position to capture. The surface morphology and roughness of the same sample can vary significantly between different imaging locations. This is because the AFM imaging range is extremely small and is closely related to the uniformity of the sample surface.

Q3: Can AFM measure samples with poor conductivity? Is gold sputtering necessary?

A: Traditional AFM analysis is versatile, accommodating both conductive and non-conductive samples without necessitating gold sputtering. Although, for specific electrical tests like KPFM, sample conductivity is essential. It's worth noting that gold sputtering, which could alter morphology due to particle size, is generally advised against.

Reference

Malenica, Mladenka, et al. "Perspectives of microscopy methods for morphology characterisation of extracellular vesicles from human biofluids."Biomedicines 9.6 (2021): 603.

Note: All of our products are for Research Use Only (RUO). NOT intended for diagnostic, therapeutic or clinical use. We DO NOT offer patients any direct products or services. No products from Creative Biolabs may be resold, modified for resale or used to manufacture commercial products without prior written approval from Creative Biolabs.